Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...

The paper describes the design-for-test (DFT) features of a 10.3125Gb/s Serdes and other such high datarate IP as XAUI, PCIe, and others. It is shown that extensive testability can be implemented in a ...

Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=2 ...

Ideally, ViewModels shouldn’t know anything about Android. This improves testability, leak safety and modularity. ViewModels have different scopes than activities or fragments. While a ViewModel is ...

AI-driven automation, tighter design-test collaboration, and evolving BiST techniques are redefining DFT strategies.

We’ve said it before: building one-offs is different from building at scale. Even on a small scale. There was a time when it was rare for a hobbyist to produce more than one of anything, but ...

To achieve ExaFLOPS computing power, it requires at least 1,000 AI chiplets interconnected by advanced high-density RDL ...

Aneeshkumar Perukilakattunirappel Sundareswaran expert process is set apart by critical commitments to major advanced change ...

Docker image providing static analysis tools for PHP. The list of available tools and the installer are actually managed in the jakzal/toolbox repository.

Writing software is an act of creation, and Android development is no exception. It’s about more than just making something ...

ACM, the Association for Computing Machinery, has named 56 Distinguished Members for their impact in the field.